Defect reasons
All applicable defect reasons are defined with a classification, containing a single attribute.
Defect classification
These are the defect classifications categories in Infor MES:
- Critical: Defects must be removed from the inventory pack.
- Major: Defects remains in the inventory pack and reported to the customer. But this affects the yield.
- Minor: Defects remain in the inventory pack but are not reported to the customer, and the data is used for improvement.
Here are some examples of defects for defect mapping:
- Undercoated/Overcoated
- Scratched
- Fingerprints
- Membrane defect
- Missing print
- Debris
- Incoming splice
- Lead material